Metrics of science and technology /

By:

Geisler, Eliezer

Material type: Text

TextLanguage: English Publication details: Quorum Books, 2000. Westport:Description: xvi, 380 pISBN:

9781567202137

Subject(s):

DDC classification:

025.00727 GEI-M

Contents:

Part I: Historical Overview -- Chapter 1. A Short History -- Chapter 2. The Emergence of Institutions -- Part II: Metrics: Approaches, Methods, Techniques -- Chapter 3. Measurement: Concepts and Issues -- Chapter 4. Selecting a Metric -- Chapter 5. Inputs to Science and Technology -- Chapter 6. Outputs from Science and Technology: Categories and Metrics -- Chapter 7. Economic and Financial Metrics -- Chapter 8. Bibliometric Measures: Publications and Citations -- Chapter 9. Co-word Analysis and Mapping of Science and Technology. Chapter 10. The Metric of Patents -- Chapter 11. The Metric of Peer Review -- Chapter 12. The Metric of Process Outcomes -- Chapter 13. Performance of Science and Technology -- Part III: Applications: The Value, in Practice, of Science and Technology -- Chapter 14. Metrics and Evaluation of Academic Science and Technology -- Chapter 15. Metrics and Evaluation of Industrial Science and Technology -- Chapter 16. Science, Technology, and Strategy -- Chapter 17. Metrics and Evaluation of Public-Sector Science and Technology -- Chapter 18. Metrics and Evaluation of National Innovation Systems. Chapter 19. Values, Ethics, and Implications --

Summary: Dr. Geisler's far-reaching, unique book provides an encyclopedic compilation of the key metrics to measure and evaluate the impact of science and technology on academia, industry, and government. Focusing on such items as economic measures, patents, peer review, and other criteria, and supported by an extensive review of the literature, Dr. Geisler gives a thorough analysis of the strengths and weaknesses inherent in metric design, and in the use of the specific metrics he cites. His book has already received prepublication attention, and will prove especially valuable for academics in technology.

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Collection	Call number	Status	Date due	Barcode	Item holds
Text/Reserve Book	Library, SPAB D-1	Non Fiction	025.00727 GEI-M (Browse shelf(Opens below))	Available		007319

Total holds: 0

Browsing Library, SPAB shelves, Shelving location: D-1, Collection: Non Fiction Close shelf browser (Hides shelf browser)

Previous								Next
Previous	025.00727 CHI-E Evaluation and performance measurement of research and development :	025.00727 EGG-P Power laws in the information production process: lotkaian informatics /	025.00727 EOM-A Author cocitation analysis:	025.00727 GEI-M Metrics of science and technology /	025.00727 HAS-M Mapping the dynamics of world agricultural research output:	025.00727 JEN-M Modern approach to bibliometric studies	025.00727 PAN-M Model bibliometric study /	Next

Part I: Historical Overview --
Chapter 1. A Short History --
Chapter 2. The Emergence of Institutions --
Part II: Metrics: Approaches, Methods, Techniques --
Chapter 3. Measurement: Concepts and Issues --
Chapter 4. Selecting a Metric --
Chapter 5. Inputs to Science and Technology --
Chapter 6. Outputs from Science and Technology: Categories and Metrics --
Chapter 7. Economic and Financial Metrics --
Chapter 8. Bibliometric Measures: Publications and Citations --
Chapter 9. Co-word Analysis and Mapping of Science and Technology. Chapter 10. The Metric of Patents --
Chapter 11. The Metric of Peer Review --
Chapter 12. The Metric of Process Outcomes --
Chapter 13. Performance of Science and Technology --
Part III: Applications: The Value, in Practice, of Science and Technology --
Chapter 14. Metrics and Evaluation of Academic Science and Technology --
Chapter 15. Metrics and Evaluation of Industrial Science and Technology --
Chapter 16. Science, Technology, and Strategy --
Chapter 17. Metrics and Evaluation of Public-Sector Science and Technology --
Chapter 18. Metrics and Evaluation of National Innovation Systems. Chapter 19. Values, Ethics, and Implications --

Dr. Geisler's far-reaching, unique book provides an encyclopedic compilation of the key metrics to measure and evaluate the impact of science and technology on academia, industry, and government. Focusing on such items as economic measures, patents, peer review, and other criteria, and supported by an extensive review of the literature, Dr. Geisler gives a thorough analysis of the strengths and weaknesses inherent in metric design, and in the use of the specific metrics he cites. His book has already received prepublication attention, and will prove especially valuable for academics in technology.

There are no comments on this title.

to post a comment.

Click on an image to view it in the image viewer